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Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission Scanning Electron Microscopy Application Note Jining Xie Agilent Technologies Introduction spatial resolution. Another dilemma Because of its high resolution, in SEM imaging of polymers is the low broad range of magnifications and contrast. Polymers usually consist of straightforward image interpretation, light elements (C, H, O and others). The scanning electron microscopy (SEM) is low atomic numbers of these elements one of the common imaging techniques in conjunction with the low density of for morphological characterization polymer results in a weak interaction of polymeric materials with various between the specimen atoms and the shapes, crystalline forms, and incident electrons leading to a poor dimensions. Unfortunately, there contrast [1, 2]. Possible methods to are some technical difficulties that enhance such a poor compositional make SEM study of polymers quite contrast are heavy-atom staining challenging. The most notorious and chemical extraction. In addition, impediment of polymer imaging polymers are susceptible to beam- by SEM is charging because most induced radiation damages. Since most polymers are highly insulating (volume of the energy carried by the electron resistivity 10 15